Article · Journal · 2022

Electronic properties and defect levels induced by n / p -type defect-complexes in Ge

E. Igumbor, O. Olaniyan, G.M. Dongho-Nguimdo, Refilwe E. Mapasha, Sohail Ahmad, E. Omotoso and 1 more

Materials Science in Semiconductor Processing

• Closed access
• International · 4 countries

Go to the publisher10.1016/j.mssp.2022.106906