Artigo · Revista · 2022

Electronic properties and defect levels induced by n / p -type defect-complexes in Ge

E. Igumbor, O. Olaniyan, G.M. Dongho-Nguimdo, Refilwe E. Mapasha, Sohail Ahmad, E. Omotoso e mais 1

Materials Science in Semiconductor Processing

• Acesso fechado
• Internacional · 4 países

Ir para a editora10.1016/j.mssp.2022.106906