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Alenju F. Obele · Peerford

University of Port Harcourt / Scholars

AO

Alenju F. Obele

University of Port Harcourt

Publishing since 2024

Control and Systems Engineering
Electrical and Electronic Engineering
Hardware and Architecture
Safety, Risk, Reliability and Quality
Software
Statistics, Probability and Uncertainty

Their record on OpenAlex

Publications: 42024
Citations: 1to those papers
h-index: 1i10-index 0
Field-weighted impact: 0.041.00 is the world average
World top 10%: 0%0 of 4 scored papers
Open access: 100%4 papers free to read

1 other work — a preprint, a dataset or the like — is listed but not counted.

By year

Papers, and the citations to them

Publications, left axisCitations to that year’s papers, right axis2026 still in progress

Citations received each year

Peerford

To all their work, old papers included. Google Scholar also counts citations from theses, books and web pages, so its line runs higher.

What they work on

From the classification of each paper

Subfields

Control and Systems Engineering4100%
Electrical and Electronic Engineering125%

Publications

4 in all

Newest Most cited Oldest Title

Search their publications by title

Reliability concerns of programmable logic controllers: Trends and methodologies from 2010-2023
2024Multidisciplinary ReviewsJournalOpen accessFirst author1 citation10.31893/multirev.2024270
A review of components of reliability for the evaluation of Programmable logic controller
2024World Journal of Electrical and Electronic Engineering

Download CV:PDF · Word

Who they write with Where their co-authors are Every publication

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Hardware and Architecture125%

Safety, Risk, Reliability and Quality125%

Software125%

Statistics, Probability and Uncertainty125%

Physical Sciences
Social Sciences

Topics most written on

Fault Detection and Control Systems4
Industrial Automation and Control Systems2
Advanced Statistical Process Monitoring1
Radiation Effects in Electronics1
Reliability and Maintenance Optimization1
Software Reliability and Analysis Research1
VLSI and Analog Circuit Testing1

Who they write with

Their most frequent co-authors, and the papers those co-authors share

Where their co-authors are

25% of their papers have a co-author abroad

papers co-written1111111Home

Most frequent partner countries

Sweden1
Thailand1

Papers with at least one author in that country.

Institutions written with most

Srinakharinwirot UniversityTH1 paper
University of GothenburgSE1 paper

Where they publish

World Journal of Electrical and Electronic Engineering2
Future Technology1
Multidisciplinary Reviews1

How it can be read

100% free to read

Diamond 2 · 50%Free to read and to publish
Hybrid 2 · 50%Open in a subscription journal

Development goals addressed

From each paper’s title and abstract

7Affordable and clean energy1
8Decent work and economic growth1
9Industry, innovation and infrastructure1

Most cited

Reliability concerns of programmable logic controllers: Trends and methodologies from 2010-2023
Multidisciplinary Reviews
20241 citationOpen access · Diamond
A review of components of reliability for the evaluation of Programmable logic controller
World Journal of Electrical and Electronic Engineering7
20240 citationsOpen access · Hybrid
A review of reliability techniques for the evaluation of Programmable logic controller
World Journal of Electrical and Electronic Engineering9
20240 citationsOpen access · Hybrid
The application of the Bayesian linear regression model to optimize the maintenance of a programmable logic controller
Future Technology8
20240 citationsOpen access · Diamond

Journal

Open access

First author

0 citations

10.31586/wjeee.2024.928

A review of reliability techniques for the evaluation of Programmable logic controller

2024World Journal of Electrical and Electronic EngineeringJournalOpen accessFirst author0 citations10.31586/wjeee.2024.947

The application of the Bayesian linear regression model to optimize the maintenance of a programmable logic controller

2024Future TechnologyJournalOpen accessFirst authorCorresponding0 citations10.55670/fpll.futech.3.3.2