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Method for Test Cost Reduction · Peerford

Article · Journal · 2003

Method for Test Cost Reduction

Kwame Osei Boateng

Proceedings of the 21st IEEE VLSI Test Symposium

Closed access

Citations: 0from other works
Field-weighted impact: —Not yet scored
Among its field: —Not yet scored
Authors: 1from 0 institutions

Authors

1 author

Kwame Osei Boateng
as printed: KO Boateng