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Reducing Test Application Time through Test Sub-Pattern Re-use · Peerford

Article · Journal · 2011

Reducing Test Application Time through Test Sub-Pattern Re-use

Kwame Osei Boateng, Kwasi Adu‐Boahen Opare

Journal of Electrical Engineering

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Citations: 0from other works
Field-weighted impact: —Not yet scored
Among its field: —Not yet scored
Authors: 2from 0 institutions

Authors

2 authors

Kwame Osei BoatengFirst author
as printed: K. O. Boateng
Kwasi Adu‐Boahen OpareSenior author
as printed: KA Opare