Article · Journal · 2007

Intrinsic gettering of nickel impuriy deep levels in silicon substrate

Ife Journal of Science

Citations: 0from other works
Field-weighted impact: 0.001.00 is the world average for its field and year
Among its field: 8th percentileby citations, against works of its field and year
Authors: 2from 2 institutions

Authors

2 authors across 2 institutions in 1 country

G.A AdegboyegaFirst author
- Adekunle Ajasin University (NG)
- Obafemi Awolowo University (NG)
as printed: G A Adegboyega
O. OsasonaSenior author
as printed: O Osasona