Article · Journal · 1999

Electrical resistivity and the Néel point of Mn100−xCrx thin films

Cryogenics

Citations: 4from other works
Field-weighted impact: 0.261.00 is the world average for its field and year
Among its field: 52nd percentileby citations, against works of its field and year
Authors: 2from 2 institutions

Authors

2 authors across 2 institutions in 1 country

F. BoakyeFirst authorCorresponding
- Kwame Nkrumah University of Science and Technology (GH)
as printed: F Boakye
K.G. AdanuSenior author
- University of Ghana (GH)
as printed: K.G Adanu