Skip to content

PeerfordResearch intelligence

Countries
Institutions
Researchers
Fields
Rankings
Compare
Commons

Search institutions, scholars, countries and publications

Countries
Institutions
Researchers
Fields
Rankings
Compare

CommonsWhere researchers talk about their work

Search institutions, scholars, countries and publications

Every figure here is counted by Peerford from the works themselves, the same way for every institution.

Browse

Countries
Institutions
Researchers
Fields
Rankings
Commons, for researchers

About

How Peerford counts
Compare institutions
Privacy
Terms of use

Contact

hello@peerford.com
https://wa.me/peerford · WhatsApp

Language

English
FrançaisFrench
PortuguêsPortuguese
العربيةArabic

Theme

SystemLightDark

BAG2-assisted analog layout synthesis for TSMC 65 nm and GPDK 45 nm · Peerford

Article · Journal · 2024

BAG2-assisted analog layout synthesis for TSMC 65 nm and GPDK 45 nm

Matthew Bio, Wolfgang Scherr, Andrew Selasi Agbemenu, Santiago Martin Sondón, Vinayak Hande, Johannes Sturm

e+i Elektrotechnik und Informationstechnik

Open access · Hybrid
International · 2 countries

Read it 10.1007/s00502-023-01203-8

Citations: 1from other works
Field-weighted impact: 0.111.00 is the world average for its field and year
Among its field: 32nd percentileby citations, against works of its field and year
Authors: 6from 2 institutions

Authors

6 authors across 2 institutions in 2 countries

Matthew BioFirst authorCorresponding
Wolfgang Scherr
Andrew Selasi Agbemenu
- Kwame Nkrumah University of Science and Technology (GH)
as printed: A. S. Agbemenu
Santiago Martin Sondón
Vinayak Hande
Johannes SturmSenior author

Development goals

9Industry, innovation and infrastructure

Funded by

Bundesministerium für Digitalisierung und Wirtschaftsstandort

Christian Doppler Forschungsgesellschaft

Österreichische Nationalstiftung für Forschung, Technologie und Entwicklung

Countries on it

Austria
Ghana

Also on it

FH Kärnteneducation · AT

Fields

A work can sit in several, each with a score

Advancements in Photolithography TechniquesTopic
Semiconductor materials and devicesTopic
VLSI and Analog Circuit TestingTopic