Article · Journal · 1989

Edge‐corrected Estimators for the Reduced Second Moment Measure of Point Processes

Biometrical Journal

Authors

2 authors across 2 institutions in 2 countries

S I S DoguwaFirst author
- Ahmadu Bello University (NG)
as printed: Sani I. Doguwa
Graham J. G. UptonSenior author