Article · Journal · 2013

By-Emitter Emulation of the Degradation of a Calibrated 975 nm Tapered Laser Bar Using a Laser Diode Simulation/Emulation Tool

Journal of Electrical and Electronic Engineering

Citations: 0from other works
Field-weighted impact: 0.001.00 is the world average for its field and year
Among its field: 7th percentileby citations, against works of its field and year
Authors: 1from 2 institutions

Authors

1 authors across 2 institutions in 2 countries