Artigo · Revista · 2023

An optimal defect recognition security-based terahertz low resolution image system using deep learning network

Samuel Akwasi Danso, Shang Liping, Deng Hu, Deng Hu, Samuel Afoakwa, Eugene Louis Batie Badzongoly e mais 5

Egyptian Informatics Journal

• Acesso aberto · Dourado
• Internacional · 2 países

Lê-lo10.1016/j.eij.2023.05.009