Article · Revue · 2015

Rutherford backscattering spectroscopy and structural analysis of DC reactive magnetron sputtered titanium nitride thin films on glass substrates

Emmanuel Ajenifuja, G.A. Osinkolu, A.Y. Fasasi, David A. Pelemo, E.I. Obiajunwa

Journal of Materials Science Materials in Electronics

• Accès fermé

Aller chez l’éditeur10.1007/s10854-015-3759-8