conference paper · مؤتمر · 1999

A new method for diagnosing multiple stuck-at faults using multiple and single fault simulations

Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146)

المؤلفون

مؤلف واحد

A new method for diagnosing multiple stuck-at faults using multiple and single fault simulations · Peerford