conference paper · منشور · 2021

A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection

Nana Kankam Gyimah, Abenezer Girma, Mahmoud N. Mahmoud, Shamila Nateghi, Abdollah Homaifar, Daniel Opoku

2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

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اقرأه10.1109/smc52423.2021.9659140